Advanced Photon Source

An Office of Science National User Facility

Sector 33: 33-ID-D,E

Introduction

The facility provides advanced x-ray scattering and diffraction techniques to a diverse scientific community and supports advanced materials research as well as condensed matter physics. Primary usage encompasses surface and interface science, diffuse x-ray scattering, and general scattering and diffraction applications. X-ray reflection interface microscopy (XRIM) is now open to general users.

Beamline contacts
Name Email Telephone
Zhan Zhang zhanzhang@aps.anl.gov 630.252.0863
Hawoong Hong hhong@aps.anl.gov 630.252.0864
Jon Tischler tischler@aps.anl.gov (630) 252-0861