Advanced Photon Source

An Office of Science National User Facility

Patents

Abstract: A method and system for performing simultaneous topographic and elemntal chemical and magnetic contrast analysis in scanning tunneling microscopy. The method and system also includes nanofabricated coaxial multilayer tips with a nanoscale conducting apex and a programmable in-situ nanomanipulator to fabricate these tips and also to rotate tips controllably.

United States Patent 8,850,611

SIMULTANEOUS TOPOGRAPHIC AND ELEMENTAL CHEMICAL AND MAGNETIC
CONTRAST IN SCANNING TUNNELING MICROSCOPY

Volker Rose, Curt A. Preissner, Saw-Wai Hla, Kangkang Wang, Daniel Rosenmann

Download

PDF iconUnited States Patent 8,850,611.pdf

Press Releases
DOE Basic Energy Sciences